Triplett MM520 True RMS 6000 Count High Performance Digital Multimeter with Certificate of Calibration to NIST - AC/DC Voltage, AC/DC Current, Resistance, Temperature, Continuity

The Triplett MM520 is a 6000 count high performance digital multimeter with True RMS readings to provide better accuracy when measuring non-sinusoidal or noisy waveforms. It offers a large variety of measurement features including AC/DC Voltage, AC/DC Current, AC/DC µA Current, Resistance, Temperature, Frequency, Capacitance, Continuity, and Diode Test. Additional features include Low Pass Filter (LPF) for filtering frequency and harmonic interference when measuring variable frequency drives, a built-in Non-Contact Voltage (NCV) Detector, data hold, relative mode. A 60A clamp adapter input can be used with virtually any clamp adapter that has a 10mV/A output. The rubberized overmolded housing provides impact and drop resistance in a sleek ergonomic design. ETL listed with CAT III 600V safety rating that provides superior resistance to damage from transient overvoltages in demanding settings. The MM520 is suited for a variety of industrial and residential applications such as security, home theater, electrical, HVAC installations and more. Includes test leads, temperature probe, pouch case, and (3) AAA batteries. 1-year warranty.

• Certificate of Calibration from the National Institute of Standards and Technology (NIST) to achieve the highest possible levels of measurement quality; Calibration can take 11-15 business days before shipment
• Measurement ranges include AC/DC Voltage, AC/DC Current, AC/DC µA Current, Resistance, Temperature, Frequency, Capacitance, Continuity, and Diode Test; Low pass filter (LPF), built-in Non-Contact Voltage (NCV) Detector, data hold, relative mode
• 60A Clamp adapter input can be used with any adapter that has a 10mV/A output
• Rubberized overmolded housing provides impact and drop resistance in a sleek ergonomic design
• ETL listed with CAT III 600V safety rating that provides superior resistance to damage from transient overvoltages in demanding settings